By Susan Brooks(eds.)

ISBN-10: 1118498518

ISBN-13: 9781118498514

ISBN-10: 111997111X

ISBN-13: 9781119971115

Part of the Wiley-Royal Microscopical Society Series, this publication discusses the speedily constructing state-of-the-art box of low-voltage microscopy, a box that has only in the near past emerged as a result of fast advancements within the electron optics layout and snapshot processing.

It serves as a consultant for present and new microscopists and fabrics scientists who're lively within the box of nanotechnology, and provides purposes in nanotechnology and learn of surface-related phenomena, permitting researches to monitor fabrics as by no means before.

Content:
Chapter 1 advent to the idea and benefits of Low Voltage Electron Microscopy (pages 1–30): David C. Bell and Natasha Erdman
Chapter 2 SEM Instrumentation advancements for Low kV Imaging and Microanalysis (pages 31–55): Natasha Erdman and David C. Bell
Chapter three severe High?Resolution (XHR) SEM utilizing a Beam Monochromator (pages 57–71): Richard J. younger, Gerard N. A. van Veen, Alexander Henstra and Lubomir Tuma
Chapter four the applying of Low?Voltage SEM—From Nanotechnology to organic examine (pages 73–95): Natasha Erdman and David C. Bell
Chapter five Low Voltage High?Resolution Transmission Electron Microscopy (pages 97–117): David C. Bell
Chapter 6 mild STEM of unmarried Atoms: Low keV Imaging and research at final Detection Limits (pages 119–161): Ondrej L. Krivanek, Wu Zhou, Matthew F. Chisholm, Juan Carlos Idrobo, Tracy C. Lovejoy, Quentin M. Ramasse and Niklas Dellby
Chapter 7 Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces (pages 163–184): Robert Klie
Chapter eight what is subsequent? the long run instructions in Low Voltage Electron Microscopy (pages 185–200): David C. Bell and Natasha Erdman

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Extra info for Low Voltage Electron Microscopy: Principles and Applications

Example text

It is equally important to utilize a detector system that will adequately detect and record the emitted signals. A variety of electron detection approaches have been implemented on the current state of the art microscope systems; we will focus on the new electron filtering capabilities and backscatter detectors specifically designed for low voltage applications. , working distance) and thus place the specimen in the flux field of the immersion lens. While in-lens SE detectors in the immersion lens microscopes are very efficient in collecting electrons, the inherent problem is that the entire range the electrons is collected, including the lowest energy electrons that also carry majority of the charge that can be detrimental for imaging.

Another, relatively uncommon (for SEM) design involves placing the specimen inside a gap of the split objective lens pole piece (true in-lens system, for example, the Hitachi SU9000). Though there are distinct differences in the approaches to obtain the best overall microscope performance in low voltage regime, there are several general trends followed in contemporary column designs: 1. Use of beam deceleration to reduce effects of lens aberrations while maintaining small probe size; either via use of beam booster (compound lens) and/or application of specimen bias.

The regions where EE1 are considered regions of ‘‘white’’ charging; when the accelerating voltage is chosen to be E1

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Low Voltage Electron Microscopy: Principles and Applications by Susan Brooks(eds.)


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