By Greg Haugstad

ISBN-10: 0470638826

ISBN-13: 9780470638828

ISBN-10: 1118360664

ISBN-13: 9781118360668

This book enlightens readers on the simple floor houses and distance-dependent intersurface forces one needs to comprehend to acquire even easy facts from an atomic strength microscope (AFM). the fabric turns into increasingly more advanced in the course of the e-book, explaining information of calibration, actual starting place of artifacts, and signal/noise boundaries. insurance spans imaging, fabrics estate characterization, in-liquid interfacial research, tribology, and electromagnetic interactions.

“Supplementary fabric for this e-book are available through coming into ISBN 9780470638828 on”

Chapter 1 evaluation of AFM (pages 1–32):
Chapter 2 Distance?Dependent Interactions (pages 33–90):
Chapter three Z?Dependent strength Measurements with AFM (pages 91–136):
Chapter four Topographic Imaging (pages 137–186):
Chapter five Probing fabric houses I: part Imaging (pages 187–257):
Chapter 6 Probing fabric houses II: Adhesive Nanomechanics and Mapping Distance?Dependent Interactions (pages 258–329):
Chapter 7 Probing fabric houses III: Lateral strength equipment (pages 330–378):
Chapter eight information Post?Processing and Statistical research (pages 379–399):
Chapter nine complicated Dynamic strength tools (pages 400–436):

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Extra resources for Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Example text

Given these capabilities, Chapter 4 covers the methodology of topographic imaging in both quasistatic (contact) and dynamic (“AC”/“tapping”) modes, including numerous realities and caveats that the AFM user will want to understand so that artifacts are avoided, accuracies are not overstated, etc. Issues affecting the choice of tip or cantilever and imaging mode will be discussed in the process. Chapter 4 also clarifies the nature of topographic data as manipulated during postprocessing. Chapter 5 focuses on phase measurement and imaging—for both diagnostic and materials contrast reasons—in dynamic AFM, including several difficulties, caveats, and calibration issues as well as examples of the kinds of information obtained.

Electronic conduction mechanisms in organic semiconductors) [30]. 18 Scanning velocity dependence of friction force for a Si3N4 tip on a (dry) gelatin surface. or thermal analyzer (DMTA) or rheometer [31], among other things, and ultimately as a tool for fundamental research in condensed-matter physics or physical chemistry. Here. we give three examples involving rate-dependent sliding friction, temperature-dependent stiffness and adhesion, and humidity-dependent phase imaging. 18 contains a graph of friction force versus tip scanning velocity, in micrometers per second ranging nearly six decades of rate—varied via a combination of scan size and scan frequency (lines per second)—on a gelatin film.

2005, Anaheim, CA: Nano Science and Technology Institute. , G. Lui, and S. Lecommandoux, eds. Block Copolymers in Nanoscience. 2006, Weinheim: Wiley-VCH. [26] Karim, A. and S. Kumar, eds. Polymer Surfaces, Interfaces and Thin Films. 2000, Singapore: World Scientific Publishing, p. 294. [27] Haugstad, G. Probing swelling and molecular conformation on polymeric coatings for biocompatibility, in 225th ACS National Meeting. 2003, New Orleans, LA: American Chemical Society. , G. L. Gladfelter, Probing polymer viscoelastic relaxations with temperature controlled friction force microscopy.

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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications by Greg Haugstad

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