By W. Richard Bowen

ISBN-10: 1856175170

ISBN-13: 9781856175173

This is the 1st publication to compile either the fundamental conception and confirmed procedure engineering perform of AFM. it really is provided in a fashion that's available and beneficial to training engineers in addition to to people who are bettering their AFM talents and data, and to researchers who're constructing new items and ideas utilizing AFM.

The publication takes a rigorous and functional process that guarantees it's without delay acceptable to strategy engineering difficulties. basics and strategies are concisely defined, whereas particular merits for approach engineering are in actual fact outlined and illustrated. Key content material contains: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.

  • Atomic strength microscopy (AFM) is a crucial software for technique engineers and scientists because it permits more suitable tactics and products
  • The basically ebook facing the speculation and useful purposes of atomic strength microscopy in approach engineering
  • Provides best-practice assistance and adventure on utilizing AFM for approach and product improvement

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Extra resources for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products

Sample text

J. C. B. Tendler, Comparison of calibration methods for atomic-force microscopy cantilevers, Nanotechnology 14 (2003) 1–6. J. A. Ducker, Experimental determination of spring constants in atomic force microscopy, Langmuir 10 (1994) 1003–1004. M. A. Ducker, Lateral, normal and longitudinal spring constants of atomic force microscopy cantilevers, Rev. Sci. Instrum. 65-8 (1994) 2257–2531. E. Sader, Susceptibility of atomic force microscope cantilevers to lateral forces, Rev. Sci. Instrum. 74 (4) (2003) 2438–2443.

4(b). The distance to the OHP can be calculated from the knowledge of the ionic crystal and hydrated ionic radii. The non-linear PBE is used to calculate the potential distribution inside the diffusive part of the electric double layer between two surfaces [18, 26]. According to the non-linear PBE, the aqueous solution is defined by its static dielectric constant only. The surface charge is usually taken as averaged over the surface, and the discrete nature of ions is not considered. In order to calculate the potential distribution around a particle, not only is the PBE needed, but the boundary conditions also have to be specified.

T. E. Smalley, Nanotubes as nanoprobes in scanning probe microscopy, Nature 384 (6605) (1996) 147–150. T. Gibson, S. J. Roberts, Attachment of carbon nanotubes to atomic force microscope probes, Ultramicroscopy 107 (10–11) (2007) 1118–1122. H. L. M. Lieber, Growth of nanotubes for probe microscopy tips, Nature 398 (6730) (1999) 761–762. [40] E. Bonnaccurso, G. Gillies, Revealing contamination on AFM cantilevers by microdrops and microbubbles, Langmuir 20 (2004) 11824–11827. [41] T. -Y. Y. L. J.

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Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products by W. Richard Bowen

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